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JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX

JEOL JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX

$ 6124.8

Availability: 100 in stock
  • Condition: Used
  • All returns accepted: ReturnsNotAccepted
  • UPC: Does not apply
  • MPN: JWS-7505
  • Brand: Jeol
  • Country/Region of Manufacture: Japan
  • Jeol 7505 SEM: Jeol Scanning Electron Microscope
  • NORAN SYSTEMS: JEOL SEM
  • Model: 7505 WAFER INSPECTION SYSTEMS

    Description

    Jeol JWS-7505 Wafer Inspection SYSTEM Scanning Electron Microscope, NORAN EDX
    USED, UNABLE TO TEST, AVAILABLE FOR INSPECTION.
    INCLUDES: NORAN SYSTEMS EDX MODEL 700P128425
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